Análisis de Struktural - Rayos X

 
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Estructura de monocristales NaCl con diferentes orientacio- nes

Principle

The spectra of the X-rays that are reflected with various different orientations by NaCl monocrystals are analysed. The associated interplanar spacings are determined based on the Bragg angles of the characteristic lines.

Tasks

  1. Determine the intensity of the X-rays that ...
 
Detalles

Num.Producto: P2541301

Investigación de estructuras cristalinas cúbicas / método Debye-Scherrer

Principle

When polycrystalline samples are irradiated with X-rays a characteristic diffraction pattern results. These Debye-Scherrer reflections are photographed and then evaluated.

Tasks

  1. Debye-Scherrer photographs are to be taken of powdered samples of sodium chloride and caesium ...
 
Detalles

Num.Producto: P2541401

Investigación de estructuras cristalinas hexagonales / méto- do Debye-Scherrer

Principle

A polycrystalline zirconium foil is irradiated with X-rays. The resulting Debye-Scherrer reflections are photographed and then evaluated.

Tasks

  1. Take Debye-Scherrer photographs of the zirconium sample.
  2. Evaluate the Debye-Scherrer rings and assign them to ...
 
Detalles

Num.Producto: P2541501

Investigación de estructuras cristalinas / método Laue

Principle

Laue diagrams are produced when monocrystals are irradiated with polychromatic X-rays. This method is primarily used for the determination of crystal symmetries and the orientation of crystals. When a LiF monocrystal is irradiated with polychromatic X-rays, a characteristic ...

 
Detalles

Num.Producto: P2541601

Investigación de estructuras cristalinas / método Laue con sensor de rayos X digital

Principle

Laue diagrams are produced when monocrystals are irradiated with polychromatic X-rays. This method is primarily used for the determination of crystal symmetries and the orientation of crystals. When a LiF monocrystal is irradiated with polychromatic X-rays, a characteristic ...

 
Detalles

Num.Producto: P2541602

Determinación de la longitud y posición de un objeto oculto

Principle

This experiment provides training in determining the length and position of an object based on an X-ray image. A metal pin that is embedded in a wooden block is used as the model. This experiment is also an excellent preparatory exercise for demonstrating the principle of computed ...

 
Detalles

Num.Producto: P2542001

Patrón de difracción Debye-Scherrer con tres redes cúbicasde Bravais (geometría Bragg-Brentano)

Principle

Polycrystalline powder samples, which crystallize in the three cubic Bravais types, simple, face-centered and body-centered, are irradiated with the radiation from a Roentgen tube with a copper anode. A swivelling Geiger-Mueller counter tube detects the radiation that is ...

 
Detalles

Num.Producto: P2542101

Patrón de difracción Debye-Scherrer de muestras de polvoscon estructura de diamante (geometría Bragg-Brentano)

Principle

Polycrystalline powder samples, which crystallize in the three cubic Bravais types, simple, face-centered and body-centered, are irradiated with the radiation from a Roentgen tube with a copper anode. A swivelling Geiger-Mueller counter tube detects the radiation that is ...

 
Detalles

Num.Producto: P2542201

Patrón de difracción Debye-Scherrer de muestras de polvoscon estructura cristalina hexagonal (geometría Bragg-Brenta- no)

Principle

A polycrystalline powder sample of zinc is irradiated with the radiation from a X-ray tube with a copper anode. A Geiger-Mueller counter tube is automatically swivelled to detect the radiation that is constructively reflected from the various lattice planes of the crystallites. ...

 
Detalles

Num.Producto: P2542301

Patrón de difracción Debye-Scherrer de muestras de polvoscon estructura cristalina tetragonal (geometría Bragg-Bren- tano)

Principle

A polycrystalline powder sample of lead dioxide is irradiated with the radiation from a X-ray tube with a copper anode. A Geiger-Mueller counter tube is automatically swivelled to detect the radiation that is constructively reflected from the various lattice planes of the ...

 
Detalles

Num.Producto: P2542401

Patrón de difracción Debye-Scherrer de muestras de polvoscon estructura cristalina cúbica (geometría Bragg-Brentano)

Principle

A cubic crystalline powder sample is irradiated with the radiation from a X-ray tube with a copper anode. A Geiger-Mueller counter tube is automatically swivelled to detect the radiation that is constructively reflected from the various lattice planes of the crystallites. The ...

 
Detalles

Num.Producto: P2542501

Medición de difracción para la determinación de intensidadde reflejos de Debye-Scherrer en una muestra de polvo cúbica (geometría Bragg-Brentano)

Principle

A polycrystalline, cubic face-centered crystallizing powder sample is irradiated with the radiation from a Roentgen tube with a copper anode. A Geiger-Mueller counter tube is automatically swivelled to detect the radiation that is constructively reflected from the various lattice ...

 
Detalles

Num.Producto: P2542601

Difractometría Debye-Scherrer para el estudio de la textura de chapas laminadas

Principle

A polycrystalline, cubic face-centered crystallizing copper powder sample and a thin copper sheet are separately irradiated with the radiation from a Roentgen tube with a copper anode. A Geiger-Mueller counter tube is automatically swivelled to detect the radiation that is ...

 
Detalles

Num.Producto: P2542701

Espectroscopía con el detector de energía de rayos X

Principle

Various metal samples are subjected to polychromatic X-rays. The resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multi-channel analyser. The maxima of intensity of the corresponding characteristic X-ray lines are determined. The ...

 
Detalles

Num.Producto: P2544001

Resolución de energía del detector de energía de rayos X

Principle

Various metal samples are subjected to polychromatic X-rays. The resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the characteristic X-ray lines and their full widths at half maximum are determined. ...

 
Detalles

Num.Producto: P2544101

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