Ensayos no destructivos de los Materiales

 
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Radiación de fluorescencia propia del detector de energía de rayos X

Principle

Fluorescence radiation of the elements of a sample can cause fluorescence radiation inside the detector and its housing if the energy is sufficiently high. As a result, the spectrum may include lines that are not caused by the sample. For the detection of potential additional ...

 
Detalles

Num.Producto: P2544201

Espectroscopía de fluorescencia de rayos X cualitativa en metales - ley de Moseley

Principle

Various metal samples are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multi channel analyser. The energy of the corresponding characteristic X-ray lines is determined and the ...

 
Detalles

Num.Producto: P2544501

Espectroscopía de fluorescencia de rayos X cualitativa en materiales aleados

Principle

The composition of various alloys is analysed with the aid of polychromatic X-rays. The energy of the characteristic fluorescence lines of the alloy constituents is analysed with the aid of a semiconductor detector and a multichannel analyser. The alloy constituents are ...

 
Detalles

Num.Producto: P2544601

Espectroscopía de fluorescencia de rayos X cualitativa en muestras de polvo

Principle

Various powder samples are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the corresponding characteristic X-ray fluorescence lines is ...

 
Detalles

Num.Producto: P2544701

Espectroscopía de fluorescencia de rayos X cualitativa en soluciones

Principle

Various saturated solutions are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor  detector and a multi-channel analyser. The energy of the corresponding characteristic X-ray fluorescence lines ...

 
Detalles

Num.Producto: P2544801

Espectroscopía de fluorescencia de rayos X cuantitativa en materiales aleados

Principle

Various alloyed materials are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the corresponding characteristic X-ray fluorescence lines is ...

 
Detalles

Num.Producto: P2545001

Espectroscopía de fluorescencia de rayos X cuantitativa en soluciones

Principle

Various solutions, with known element concentrations, are subjected to polychromatic X-rays. The energy and intensity of the resulting fluorescence radiation of the dissolved elements are analysed with the aid of a semiconductor detector and a multichannel analyser. In order to ...

 
Detalles

Num.Producto: P2545101

Espectroscopía de fluorescencia de rayos X / determinación del espesor de película

Principle

X-ray fluorescence analysis (XRF) is suitable for the non-contact and non-destructive thickness measurement of thin layers as well as for determining their chemical composition. For this type of measurement, the X-ray source and detector are located on the same side of the ...

 
Detalles

Num.Producto: P2545201

Efecto Compton - medición directa de dispersión de energía

Principle

Photons of the molybdenum Kα X-ray line are scattered at the quasi-free electrons of an acrylic glass cuboid. The energy of the scattered photons is determined in an angle-dependent manner with the aid of a swivelling semiconductor detector and a ...

 
Detalles

Num.Producto: P2546001

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X-ray expert unit

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PHYWE presenta la nueva unidad de rayos X: tecnología innovadora, máxima seguridad y comodidad.

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