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Espectroscopía de fluorescencia de rayos X cualitativa en muestras de polvo

Principle

Various powder samples are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the corresponding characteristic X-ray fluorescence lines is ...

 
Detalles

Num.Producto: P2544701

Espectroscopía de fluorescencia de rayos X cualitativa en soluciones

Principle

Various saturated solutions are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor  detector and a multi-channel analyser. The energy of the corresponding characteristic X-ray fluorescence lines ...

 
Detalles

Num.Producto: P2544801

Espectroscopía de fluorescencia de rayos X cualitativa en minerales

Principle

Various ore samples are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the corresponding characteristic X-ray fluorescence lines is ...

 
Detalles

Num.Producto: P2544901

Espectroscopía de fluorescencia de rayos X cuantitativa en materiales aleados

Principle

Various alloyed materials are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the corresponding characteristic X-ray fluorescence lines is ...

 
Detalles

Num.Producto: P2545001

Espectroscopía de fluorescencia de rayos X cuantitativa en soluciones

Principle

Various solutions, with known element concentrations, are subjected to polychromatic X-rays. The energy and intensity of the resulting fluorescence radiation of the dissolved elements are analysed with the aid of a semiconductor detector and a multichannel analyser. In order to ...

 
Detalles

Num.Producto: P2545101

Espectroscopía de fluorescencia de rayos X / determinación del espesor de película

Principle

X-ray fluorescence analysis (XRF) is suitable for the non-contact and non-destructive thickness measurement of thin layers as well as for determining their chemical composition. For this type of measurement, the X-ray source and detector are located on the same side of the ...

 
Detalles

Num.Producto: P2545201

Efecto Compton - medición directa de dispersión de energía

Principle

Photons of the molybdenum Kα X-ray line are scattered at the quasi-free electrons of an acrylic glass cuboid. The energy of the scattered photons is determined in an angle-dependent manner with the aid of a swivelling semiconductor detector and a ...

 
Detalles

Num.Producto: P2546001

Mediciones de dispersión de energía de bordes de absorción K y L

Principle

Thin powder samples are subjected to polychromatic X-rays. The energy of the radiation that passes through the samples is analysed with the aid of a semiconductor detector and a multi-channel analyser. The energy of the corresponding absorption edges is determined and the ...

 
Detalles

Num.Producto: P2546101

Determinación de la constante de rejilla de un monocristal

Principle

Polychromatic X-rays impinge on a monocrystal under various glancing angles. The rays are reflected by the lattice planes of the monocrystal. An energy detector is only used to measure those radiation parts that interfere constructively. The lattice constant of the crystal is ...

 
Detalles

Num.Producto: P2546201

Ley de desplazamiento de Duane-Hunt

Principle

X-ray spectra of an X-ray tube are measured in an energy dispersive manner with a semiconductor detector and with various anode voltages. Duane and Hunt's  law of displacement is verified with the aid of the maximum energy of the bremsspectrum.

Tasks

  1. Recording of the ...
 
Detalles

Num.Producto: P2546301

Tomografía computarizada - CT

Kit completo para estudio de Tomografía Computarizada CT, demostración  de  los  principios  básicos  del  CT, endurecimiento  de  haz,  artefactos  y  algoritmos.

El  conjunto  actualizado  de  ...

 
Detalles

Num.Producto: P2550100

Principios de las imágenes de rayos X digitales

Principle

With digital X-ray imaging, X-ray photons that interact with the detector are converted to a digital signal. This permits to record digital radiographies. With this experiment, the principles of digital detectors for X-ray imaging are laid out.

Tasks

  1. Define a good exposure ...
 
Detalles

Num.Producto: P2550101

Principios de atenuación y contraste de rayos X

 
Detalles

Num.Producto: P2550200

Principios de intensidad del haz

 
Detalles

Num.Producto: P2550300

Principios de resolución y detectabilidad de detalle

Principle

In X-ray imaging, resolution is an important factor. It determines the sharpness of the images and the de-tails of a sample that can be observed. In this experiment, the different factors that determine the resolu-tion are investigated.

Tasks

  1. Investigate the resolution in ...
 
Detalles

Num.Producto: P2550400

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X-ray expert unit

Este producto es un mundo primero

PHYWE presenta la nueva unidad de rayos X: tecnología innovadora, máxima seguridad y comodidad.

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